Department of Earth and Planetary Sciences

JEOL JXA-iHP 200F Microprobe
Hitachi SU5000 Field Emission Scanning Electron Microscope
Renishaw inVia Reflex Raman Microscope

Thank to CFI, we obtain three major instruments: JEOL JXA-iHP 200F (installed 2025), Hitachi SU5000 Field Emission Scanning Microscope and Renishaw inVia Reflex Raman Microscope in 2016. These three instruments include the new technologies and have new features which increase the abilities of the researches in geology, mining, material sciences, medicine, chemistry etc. fields. The software with these new instruments makes them easy to use for many researchers and students.

  • For more information contact: Lang Shi
  • Phone: 514 3986767
  • Fax: 514 3984680
  • Email: lang.shi@mcgill.ca
  • Room 238, FDA building
  • Earth and Planetary Sciences
  • McGill University
  • 3450 University Street
  • Montreal, Quebec, Canada
  • H3A 0E8

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