Department of Earth and Planetary Sciences

The lab is equipped with a new JEOL 8900 purchased in 1993 with the help of an NSERC grant. The important features of the instrument are:

• 5 WDS spectrometers including one with a small Rowland circle for trace elements, one four crystal spectrometer and two synthetic multilayers for the analysis of light elements (B - F)
• A Si(Li) EDS detector
• Full integration of WDS and EDS Spectrometers allowing simultaneous WDS/EDS work
• Secondary and Backscatter imaging with magnification from 40 to 300,000x and 70 nm resolution. Images may be acquired digitally for further processing , or on film.
• High resolution digital X-Ray mapping with both EDS and WDS spectrometers and image processing software for image analysis
• All analytical modes are fully automated, allowing unattended use

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For more information contact: lang.shi@mcgill.ca
Tel: (514) 398 6774/(514) 293 9087
Fax: (514) 398 4680

Microanalysis Laboratory
Earth and Planetary Sciences
McGill University
3450 University Street
Montreal (Quebec) Canada H3A 2A7

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